Work Areas

  • Topographical analysis of technical surfaces (geometry and roughness)
  • Topographical analysis of microstructures
  • Analysis of optical characteristics of components and materials.

 

Service Offers

  • Optical characterisation of microstructures
  • Characterisation of optical components and materials in terms of refractive, spectral and optical polarisation properties.
  • Optical structural examination using OCT
  • Cooperative research projects

 

Equipment

  • Confocal microscope
  • Chromatic sensor
  • Optical coherence tomography
  • White light reflectometry (layer thickness measurement, transmission, reflection)
  • Multi wavelength refractometer (refraction index in VIS and IR)
  • Spectro-gonio radiometer (radiometrics and photometrics of LEDs and other sources of radiation)
  • High-resolution optical spectrum analyser (spectral analysis in the 350 - 1700 nm range)
  • Laser metrology (performance, energy, wavelength, polarisation)
  • Measuring station for characterising lenses (BFL, EFL, MTF, lens defects)
  • Shack-Hartmann sensor (wave front analysis) 

 

In collaboration with other work groups within the Materials Department, the following are also available

 

  • Scanning electron microscope
  • Atomic force microscope
  • Computer tomography scanner
  • X-ray fluorescence analysis

 

 

 

ZeWiS-Zentrum für wissenschaftliche Services
Glanzstoffstraße 1, Geb. Wa 07
63784 Obernburg